The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 21, 2021
Filed:
May. 24, 2016
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventor:
Murray A. Reicher, Rancho Santa Fe, CA (US);
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16H 50/20 (2018.01); G16H 40/63 (2018.01); G16H 50/50 (2018.01); G16H 15/00 (2018.01); G16H 30/40 (2018.01); G06T 7/00 (2017.01); G01R 33/48 (2006.01); G06T 11/60 (2006.01); G16H 20/40 (2018.01);
U.S. Cl.
CPC ...
G16H 50/20 (2018.01); G01R 33/4812 (2013.01); G06T 7/0016 (2013.01); G06T 11/60 (2013.01); G16H 15/00 (2018.01); G16H 30/40 (2018.01); G16H 40/63 (2018.01); G16H 50/50 (2018.01); G06T 2207/20104 (2013.01); G06T 2207/30096 (2013.01); G09G 2380/08 (2013.01); G16H 20/40 (2018.01);
Abstract
Annotations of medical images may be generated using one or more lexicons so that terminology is consistent across multiple exams, users, facilities, etc. Measurements of lesions may be provided using a bilinear measurement tool that allows easier bilinear measurements. Disease assessment models may be selected and applied as measurements are acquired in order to provide immediate determination of disease staging according to one or more selected assessment models.