The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 21, 2021
Filed:
Jul. 13, 2021
Jiangnan University, Wuxi, CN;
Gaoming Jiang, Wuxi, CN;
Honglian Cong, Wuxi, CN;
Fenglin Xia, Wuxi, CN;
Qi Zhang, Wuxi, CN;
Peixiao Zheng, Wuxi, CN;
Jiangnan University, Wuxi, CN;
Abstract
The disclosure discloses an online detection method of circular weft knitting stripe defects based on a gray gradient method, and belongs to the technical field of textile product detection. The method provides a defect detection and positioning method based on the gray gradient method. Before the detection on a new product, only a model needs to be trained to obtain stripe defect feature images with different stitch types and different stitch densities, and the detection is directly performed in a subsequent process. Defects can be fast and accurately recognized, and a cam position causing the stripe defects can be calculated according to a quantity of shot images between the feature images and a marked image, courses in which marks in the marked image are located, courses in which defects in a defect image are located, and machine operation parameters. Moreover, a defect detection device required by the disclosure can be modified on an original circular knitting machine, so the detection cost is reduced.