The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 21, 2021

Filed:

Mar. 16, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Hazar Yüksel, New York, NY (US);

Giovanni Cherubini, Rueschlikon, CH;

Roy Cideciyan, Rüschlikon, CH;

Simeon Furrer, Altdorf, CH;

Marcel Kossel, Reichenburg, CH;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/06 (2006.01); G06N 7/00 (2006.01); G06N 5/00 (2006.01); H03M 13/41 (2006.01); H03M 13/39 (2006.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01); G06N 5/003 (2013.01); H03M 13/4138 (2013.01); H03M 13/3961 (2013.01);
Abstract

Methods and apparatus are provided for calculating branch metrics, associated with possible transitions between states of a trellis, in a sequence detector for detecting symbol values corresponding to samples of an analog signal transmitted over a channel. For each sample and each transition, the method calculates a plurality of distance values indicative of distance between that sample and respective hypothesized sample values for that transition. In parallel with calculation of the distance values, the sample is compared with a set of thresholds, each defined between a pair of successive hypothesized symbol values arranged in value order, to produce a comparison result. An optimum distance value is selected as a branch metric for the transition in dependence on the comparison result.


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