The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 21, 2021

Filed:

Nov. 19, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventor:

Ke Du, Xi'An, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/2458 (2019.01); G06F 16/2457 (2019.01); G06F 16/2453 (2019.01); G06F 16/21 (2019.01); G06F 17/18 (2006.01); G06F 17/16 (2006.01);
U.S. Cl.
CPC ...
G06F 16/2462 (2019.01); G06F 16/212 (2019.01); G06F 16/24534 (2019.01); G06F 16/24575 (2019.01); G06F 17/16 (2013.01); G06F 17/18 (2013.01);
Abstract

Methods and systems for querying data are disclosed. In disclosed embodiments, a data set is batched to a first data set in a first range and a second data set in a second range, the batching based on a determination of data fluctuation of the data set. A first model that includes an m order polynomial based on the first data set and a second model that includes an n order polynomial based on the second data set is generated. In embodiments, a query of the data set is received, spanning at least a portion of the range of the first and second data sets. A query output is generated in response to the query, based on output from the first model and second model.


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