The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 21, 2021
Filed:
Oct. 10, 2019
Datometry, Inc., San Francisco, CA (US);
Florian Michael Waas, San Francisco, CA (US);
Dmitri Korablev, San Francisco, CA (US);
Michele Gage, San Francisco, CA (US);
Mark Morcos, Oakland, CA (US);
Amirhossein Aleyasen, Urbana, IL (US);
DATOMETRY, INC., San Francisco, CA (US);
Abstract
Some embodiments provide a method for analyzing database queries performed on a database. The method receives a log that includes a set of database queries that were performed on the database. The method identifies, from the log, two or more subsets of queries that are each associated with a different connection session between the database and a set of client applications, where each subset is associated with a set of temporary session objects that are not associated with queries in the other subsets of queries. The method performs a separate query interpretation process on each subset of queries to quantify the impact of performing the queries on the database during the connection sessions, where the query interpretation processes are performed separately in order to avoid errors associated with the temporary objects.