The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 21, 2021

Filed:

May. 14, 2020
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Aaron Ren Wang, Shanghai, CN;

Qi Wang, Shanghai, CN;

Yun Zhang, Shanghai, CN;

Weiyang Liu, Shanghai, CN;

Ming Zhang, Shanghai, CN;

Assignee:

EMC IP HOLDING COMPANY LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 9/54 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3692 (2013.01); G06F 9/54 (2013.01); G06F 11/302 (2013.01); G06F 11/3684 (2013.01); G06F 11/3688 (2013.01);
Abstract

A method, a device, and a program product for evaluating an application program interface (API) are provided in embodiments of the present disclosure. According to some embodiments, a method for evaluating an API includes determining a specification score of the API by comparing a definition description for the API with a predetermined specification corresponding to the API. The specification score indicates a degree of matching between the definition description and the predetermined specification. Additionally, the method for evaluating an API includes determining a test score for the API by applying a predetermined test case set to a code set of the API. The test score indicates a test status for the code set. Further, the method for evaluating an API includes determining a maturity metric of the API based on the specification score and the test score.


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