The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 21, 2021
Filed:
Dec. 21, 2018
Microsoft Technology Licensing, Llc, Redmond, WA (US);
Kexin Nie, Sunnyvale, CA (US);
Yanbin Jiang, Sunnyvale, CA (US);
Yang Yang, Fremont, CA (US);
Boyi Chen, Santa Clara, CA (US);
Shilpa Gupta, Mountain View, CA (US);
Zheng Li, San Jose, CA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
Technologies for monitoring performance of a machine learning model include receiving, by an unsupervised anomaly detection function, digital time series data for a feature metric; where the feature metric is computed for a feature that is extracted from an online system over a time interval; where the machine learning model is to produce model output that relates to one or more users' use of the online system; using the unsupervised anomaly detection function, detecting anomalies in the digital time series data; labeling a subset of the detected anomalies in response to a deviation of a time-series prediction model from a predicted baseline model exceeding a predicted deviation criterion; creating digital output that identifies the feature as associated with the labeled subset of the detected anomalies; causing, in response to the digital output, a modification of the machine learning model.