The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 21, 2021

Filed:

Oct. 28, 2020
Applicant:

Qingdao Research Institute of Beihang University, Shandong, CN;

Inventors:

Feng Lu, Shandong, CN;

Yang Yu, Shandong, CN;

Kai Li, Shandong, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/01 (2006.01);
U.S. Cl.
CPC ...
G06F 3/013 (2013.01);
Abstract

A test method for an eye tracking algorithm creatively defines indicators for eye tracking algorithm performance test, and proposes a general environment and an overall process for the eye tracking algorithm performance test to realize the versatility of the eye tracking algorithm test, improve the algorithm development efficiency, shorten the development cycle, and provide a direction and reference for the algorithm development and iteration. The test method decouples the performance test of an eye tracking algorithm from development of the eye tracking algorithm itself, so that a test environment is not limited to a specific eye tracking algorithm and a general performance test environment for the eye tracking algorithm is established. The test method includes: defining indicators for the eye tracking algorithm performance test, defining an overall architecture of a performance test environment of the eye tracking algorithm, and proposing steps for performing the eye tracking algorithm performance test.


Find Patent Forward Citations

Lu, Feng. (2021). Test method for eye tracking algorithm (U.S. Patent No. 11204642). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11204642

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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