The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 21, 2021

Filed:

Mar. 13, 2020
Applicant:

Shanghai United Imaging Healthcare Co., Ltd., Shanghai, CN;

Inventors:

Yu Ding, Houston, TX (US);

Renjie He, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/565 (2006.01); G06F 17/14 (2006.01); A61B 5/055 (2006.01); G01R 33/48 (2006.01); G01R 23/16 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01R 33/565 (2013.01); G01R 23/16 (2013.01); G01R 33/4818 (2013.01); G01R 33/5659 (2013.01); G06F 17/14 (2013.01); A61B 5/0013 (2013.01); A61B 5/055 (2013.01); A61B 5/7257 (2013.01); A61B 2576/00 (2013.01);
Abstract

The disclosure relates to a system and method for correcting inhomogeneity in an MRI image. The method may include the steps of: acquiring a first set of k-space data, acquiring a second set of k-space data, generating the convolution kernel of the first set of k-space data based on the first set of k-space data and the second set of k-space data, performing inverse Fourier transform on the convolution kernel of the first set of k-space data to obtain an inversely transformed convolution kernel of the first set of k-space data, and generating a corrector based on the inversely transformed convolution kernel of the first set of k-space data. The method may be implemented on a machine including at least one processor and storage.


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