The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 21, 2021

Filed:

Aug. 28, 2018
Applicant:

Schweitzer Engineering Laboratories, Inc., Pullman, WA (US);

Inventors:

Bogdan Z. Kasztenny, Markham, CA;

Tony J. Lee, Pullman, WA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 23/02 (2006.01); G01R 35/00 (2006.01); G01R 19/25 (2006.01);
U.S. Cl.
CPC ...
G01R 23/02 (2013.01); G01R 19/2513 (2013.01); G01R 35/005 (2013.01);
Abstract

Disclosed herein are systems and methods for estimating a period and frequency of a waveform. In one embodiment a system may comprise an input configured to receive a signal comprising a representation of the waveform. A period determination subsystem may calculate an estimated period of the signal based on a period determination function. An estimated period adjustment subsystem may determine an adjustment to the estimated period based on a result of the period determination function. A quality indicator subsystem configured to evaluate a measurement quality indictor function based on the estimated period, and to selectively update the period of the waveform based on the measurement quality indicator. A control action subsystem configured to implement a control action based on the period of the waveform.


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