The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 21, 2021
Filed:
Sep. 20, 2018
University Court of the University of St Andrews, College Gate, Fife, GB;
Kishan Dholakia, Fife, GB;
Abstract
A method and system are disclosed for use in imaging a sample. The method comprises illuminating a sample through a scattering medium, or illuminating a sub-surface region of the sample through a scattering surface region of the sample, with a plurality of spatial patterns of incident electromagnetic radiation, wherein each spatial pattern of incident electromagnetic radiation interacts with the sample, or the sub-surface region of the sample, to generate electromagnetic radiation in the sample or the sub-surface region of the sample. The method comprises measuring, for each spatial pattern of incident electromagnetic radiation, a corresponding value representative of a quantity of at least a portion of the emitted electromagnetic radiation and using the plurality of spatial patterns of incident electromagnetic radiation and the plurality of corresponding measured values to determine an image of the sample, or an image of the sub-surface region of the sample, without using a spatial distribution of the emitted electromagnetic radiation.