The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 21, 2021

Filed:

Dec. 21, 2018
Applicant:

Sony Semiconductor Solutions Corporation, Kanagawa, JP;

Inventors:

Yalcin Incesu, Stuttgart, DE;

Alexander Gatto, Stuttgart, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/02 (2006.01); G01J 3/26 (2006.01); G01J 3/32 (2006.01); G01J 3/12 (2006.01);
U.S. Cl.
CPC ...
G01J 3/2823 (2013.01); G01J 3/0208 (2013.01); G01J 3/26 (2013.01); G01J 3/28 (2013.01); G01J 3/2803 (2013.01); G01J 3/32 (2013.01); G01J 2003/1213 (2013.01); G01J 2003/2826 (2013.01);
Abstract

An apparatus comprising a spectral filter () with a variable spectral filter transmission (FT(λ)); an event-based imaging sensor () configured to produce measurement events (y, y, . . . , y) which correspond to a change in a filter response (Y(t)) that is generated by an observed spectrum (X(λ)), and a processor () configured to control the filter transmission (FT(λ)) of the spectral filter () so that it sweeps over wavelength (λ) with time (t), and to generate an estimation (X*(λ)) of the observed spectrum (X(λ)) based on the measurement events (y, y, . . . , y) that correspond to the filter response (Y(t)) and based on the filter transmission (FT(λ)).


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