The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 21, 2021

Filed:

May. 21, 2020
Applicant:

Analytik Jena Ag, Jena, DE;

Inventors:

Stefan Münch, Berlin, DE;

Michael Okruss, Potsdam, DE;

Marco Braun, Jena, DE;

Assignee:

Analytik Jena GmbH, Jena, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/10 (2006.01); G01J 3/18 (2006.01); G01J 3/28 (2006.01); G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G01J 3/1809 (2013.01); G01J 3/0208 (2013.01); G01J 3/10 (2013.01); G01J 3/2803 (2013.01); G01J 3/2823 (2013.01);
Abstract

The present disclosure relates to a spectrometer arrangement for analyzing optical radiation from a light source comprising an echelle grating for dispersion of the radiation entering the spectrometer arrangement in a main dispersion direction, a dispersion element for dispersing the radiation in a cross-dispersion direction, the main dispersion direction and the cross-dispersion direction having a predeterminable angle to each other, and a detector unit for acquiring a first spectrum of a first part of the radiation comprising a first predeterminable wavelength range. According to the present disclosure, the spectrometer arrangement comprises a first optical element, which is arranged or configured in such a way that a second spectrum of a second part of the radiation comprising a second predeterminable wavelength range differing from the first can be acquired by means of the detector unit.


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