The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 21, 2021

Filed:

Mar. 29, 2019
Applicant:

The United States of America, As Represented BY the Secretary of the Navy, Crane, IN (US);

Inventors:

Hitesh D Vora, Stillwater, OK (US);

Subrata Sanyal, Norco, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/393 (2017.01); B29C 64/268 (2017.01); B29C 64/188 (2017.01); G06N 3/08 (2006.01); B33Y 50/02 (2015.01); B33Y 30/00 (2015.01); B33Y 40/20 (2020.01);
U.S. Cl.
CPC ...
B29C 64/393 (2017.08); B29C 64/188 (2017.08); B29C 64/268 (2017.08); G06N 3/08 (2013.01); B33Y 30/00 (2014.12); B33Y 40/20 (2020.01); B33Y 50/02 (2014.12);
Abstract

Apparatuses and methods are provided that provide adaptive multi-process additive manufacturing systems for monitoring, measuring, and controlling additive manufacturing processes. A first laser (e.g., a fiber laser) is used for melting and consolidating the powder, and a second laser is utilized for dual purpose: (a) for metrology to measure the surface roughness, dimensional accuracy, material properties, etc., and (b) based on the evaluated measurements to take corrective actions (laser ablation, etc.) to attain the desired surface finish and dimensional accuracy. Various elements provide defect detection, defect identification, and defect response actions which remove defect related material or address under print or missing material in a build object.


Find Patent Forward Citations

Loading…