The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2021

Filed:

Apr. 08, 2019
Applicant:

Continuse Biometrics Ltd., Tel Aviv, IL;

Inventors:

Zeev Zalevsky, Rosh HaAyin, IL;

Ran Califa, Givataym, IL;

Mark Golberg, Rehovot, IL;

Zeev Markman, Bet-Dagan, IL;

Michael Shegei, Petah-Tikva, IL;

Yevgeny Beiderman, Tel Aviv, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04N 5/225 (2006.01); H04N 5/232 (2006.01); H04N 5/238 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
H04N 7/18 (2013.01); H04N 5/2256 (2013.01); H04N 5/238 (2013.01); H04N 5/23229 (2013.01); A61B 5/0059 (2013.01);
Abstract

A system and technique are described, for use in optical monitoring of objects. The system comprising: a collection unit comprising at least one optical arrangement and at least one detector array arranged for defocused collection of light returning from a selected region on the object; and image data collection circuitry configured for receiving electronic signals associated with data piece collected by pixels of the at least one detector array and for generating output data indicative of correlation function between image frames collected by the detector array at two or more different temporal instances. The technique thereby enables determining of correlation between image data pieces with reduced computational complexity.


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