The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2021

Filed:

Sep. 08, 2020
Applicant:

Ciena Corporation, Hanover, MD (US);

Inventors:

Jerry Yee-Tung Lam, Stittsville, CA;

Sadok Aouini, Gatineau, CA;

Naim Ben-Hamida, Nepean, CA;

Assignee:

Ciena Corporation, Hanover, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/28 (2006.01); H04L 5/12 (2006.01); H04L 7/033 (2006.01); H03L 7/081 (2006.01); G06F 1/08 (2006.01);
U.S. Cl.
CPC ...
H04L 7/0337 (2013.01); H03L 7/0814 (2013.01); G06F 1/08 (2013.01);
Abstract

Described herein are apparatus and methods for highly linear phase rotators with continuous rotation. A method includes generating a first code and a second code based on a desired offset to match a first and second frequency, respectively, calibrating the first code and the second code based on first phase rotator characteristics and second phase rotator characteristics, respectively, generating first N phase offset codes and second N phase offset codes from a calibrated first and second code, respectively, wherein each phase offset code constrains functionality of the first phase rotator and the second phase rotator, respectively, associated with a phase of the input clock to a defined region of operation, rotating a clock using the first N phase offset codes and the second N phase offset codes to match the first and second frequency, respectively.


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