The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2021

Filed:

Oct. 28, 2019
Applicant:

Nanning Fugui Precision Industrial Co., Ltd., Nanning, CN;

Inventors:

Ying-Chieh Wang, New Taipei, TW;

Yi-Hao Chang, New Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 3/26 (2006.01); H01Q 21/29 (2006.01); H04B 17/318 (2015.01); H04B 17/10 (2015.01); H01Q 3/24 (2006.01);
U.S. Cl.
CPC ...
H01Q 3/26 (2013.01); H01Q 3/24 (2013.01); H01Q 21/29 (2013.01); H01Q 21/293 (2013.01); H04B 17/102 (2015.01); H04B 17/318 (2015.01);
Abstract

An antenna device includes a first antenna group comprising multiple antennas, configured to receive and transmitting signals; a second antenna group comprising multiple antennas, configured to receive and transmitting signals; a processor coupled to the first antenna group by a first electronic switch, coupled to the second antenna group by a second electronic switch, configured to divide radiation pattern of antenna combination of the first antenna group and the second antenna group into a predetermined number of characteristic patterns, and further configured to calculate similarities of the characteristic patterns and the RSSI of each characteristic pattern; wherein when the antenna device is in operation, the processor reads and analyzes RSSI of the signals, and compares with the RSSI of the characteristic patterns, and then determines the matched characteristic pattern group according to results of the comparisons and the similarities of the characteristic patterns.


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