The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2021
Filed:
Jul. 27, 2017
Applicant:
Sequenom, Inc., San Diego, CA (US);
Inventors:
Amin Mazloom, San Diego, CA (US);
Cosmin Deciu, San Diego, CA (US);
Chen Zhao, San Diego, CA (US);
Tong Liu, San Diego, CA (US);
Yijin Wu, San Diego, CA (US);
Assignee:
Sequenom, Inc., San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16B 20/10 (2019.01); G16B 40/00 (2019.01); G16B 20/00 (2019.01); G16B 20/20 (2019.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G16B 20/10 (2019.02); G06N 7/005 (2013.01); G16B 20/00 (2019.02); G16B 20/20 (2019.02); G16B 40/00 (2019.02);
Abstract
Technology provided herein relates in part to non-invasive classification of one or more genetic copy number alterations (CNAs) for a test sample. Certain methods include sampling a quantification of sequence reads from parts of a genome, generating a confidence determination, and using the confidence determination to enhance classification. Technology provided herein is useful for classifying a genetic CNA for a sample as part of non-invasive pre-natal (NIPT) testing and oncology testing, for example.