The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2021

Filed:

Aug. 27, 2018
Applicant:

Ignis Innovation Inc., Waterloo, CA;

Inventors:

Gholamreza Chaji, Waterloo, CA;

Ricky Yik Hei Ngan, Richmond Hills, CA;

Nino Zahirovic, Waterloo, CA;

Assignee:

Ignis Innovation Inc., Waterloo, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/3225 (2016.01); G09G 3/3291 (2016.01);
U.S. Cl.
CPC ...
G09G 3/3225 (2013.01); G09G 3/3291 (2013.01); G09G 2300/0413 (2013.01); G09G 2320/029 (2013.01); G09G 2320/0285 (2013.01); G09G 2320/043 (2013.01); G09G 2360/145 (2013.01);
Abstract

A system for equalizing the pixels in an array of pixels that include semiconductor devices that age differently under different ambient and stress conditions. The system extracts at least one pixel parameter from the array; creates a stress pattern for the array, based on the extracted pixel parameter; stresses the pixels in accordance with the stress pattern; extracts the pixel parameter from the stressed pixels; determines whether the pixel parameter extracted from the stressed pixels is within a preselected range and, when the answer is negative, creates a second stress pattern for the array, based on the pixel parameter extracted from the stressed pixels, stresses the pixels in accordance with the second stress pattern, extracts the pixel parameter from the stressed pixels, and determines whether the pixel parameter extracted from the stressed pixels is within the preselected range.


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