The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2021

Filed:

Sep. 30, 2020
Applicant:

Realtek Semiconductor Corp., HsinChu, TW;

Inventors:

Zong-Da Huang, HsinChu, TW;

Ching-Lan Yang, HsinChu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/00 (2006.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G09G 2330/12 (2013.01);
Abstract

An image processing chip test method comprising: controlling a power supply circuit to provide a first operating voltage to an image processing chip comprising a storage device; and when reading written first image data from the storage device, the test device receives a first error detection code corresponding to the first image data and determines whether the first error detection code means an error occurs. If an error occurs, record the first operating voltage as an erroneous operating voltage, and if the error does not occur, provide a second operating voltage to the image processing chip. Also, when the written second image data is read from the storage device, the test device receives a second error detection code corresponding to the second image data and determines whether the second error detection code means an error occurs.


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