The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2021
Filed:
May. 24, 2019
Hefei Xinsheng Optoelectronics Technology Co., Ltd., Anhui, CN;
Boe Technology Group Co., Ltd., Beijing, CN;
Wenchao Bao, Beijing, CN;
Xiaolong Wei, Beijing, CN;
HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD., Hefei, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
Abstract
The present disclosure provides a method and a device for abnormal data processing. The method includes: acquiring a queue of data to be detected, wherein the queue of data to be detected comprises M data arranged sequentially, M being a positive integer; filtering the queue of data to be detected with a filtering algorithm in at least two different orders respectively, wherein a window used in the filtering algorithm has a size of N, N being a positive integer smaller than M; determining abnormal data in the queue of data to be detected according to the filtering result; and performing data replacement on the abnormal data according to a preset rule.