The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2021
Filed:
Dec. 11, 2019
Flir Systems Ab, Taby, SE;
Jonas Sandsten, Lomma, SE;
Per Lilja, Akersberga, SE;
Henning Hagman, Taby, SE;
Marta Barenthin-Syberg, Stockholm, SE;
Tien Nguyen, Taby, SE;
FLIR Systems AB, Täby, SE;
Abstract
An ambient temperature calibration process includes, in accordance with an embodiment, determining an ambient temperature calibration value for a global external resistance associated with a read out integrated circuit (ROIC) of an image capture component comprising a sensor array comprising a focal plane array of microbolometers arranged on the ROIC; determining an ambient temperature calibration value for a sensor integration time associated with the ROIC; and determining an ambient temperature calibration mapping for an offset mapping associated with the ROIC.