The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2021

Filed:

Sep. 04, 2019
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Norihiko Moriwaki, Tokyo, JP;

Kazuo Yano, Tokyo, JP;

Nobuo Sato, Tokyo, JP;

Shinichi Fukuma, Tokyo, JP;

Hiroyuki Tomita, Tokyo, JP;

Miki Hayakawa, Tokyo, JP;

Norio Ohkubo, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/06 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/0639 (2013.01);
Abstract

A generation technique and an analysis technique of a large number of explanatory variables to derive effective measures by using various data are provided. Specifically, a factor which lurks in a large amount of data and affects business performance is identified by automatically generating a large number of explanatory variables and performing correlation analysis between the explanatory variables and an objective variable. Three operators representing condition, target, and arithmetic which are variable generation conditions are defined in advance for data inputted into an analysis system and a large number of explanatory variables are automatically generated by these operators.


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