The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2021

Filed:

Mar. 31, 2021
Applicant:

Element Biosciences, Inc., San Diego, CA (US);

Inventors:

Chunhong Zhou, San Diego, CA (US);

Semyon Kruglyak, San Diego, CA (US);

Francisco Garcia, San Diego, CA (US);

Minghao Guo, San Diego, CA (US);

Haosen Wang, San Diego, CA (US);

Ryan Kelly, San Diego, CA (US);

Assignee:

Element Biosciences, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/00 (2006.01); G06T 7/30 (2017.01);
U.S. Cl.
CPC ...
G06K 9/622 (2013.01); G06K 9/0014 (2013.01); G06K 9/00134 (2013.01); G06K 9/6202 (2013.01); G06T 7/30 (2017.01); G06K 2209/07 (2013.01);
Abstract

Methods and systems for image analysis are provided, and in particular for identifying a set of base-calling locations in a flow cell for DNA sequencing. These include capturing flow cell images after each sequencing step performed on the flow cell, and identifying candidate cluster centers in at least one of the flow cell images. Intensities are determined for each candidate cluster center in a set of flow cell images. Purities are determined for each candidate cluster center based on the intensities. Each candidate cluster center with a purity greater than the purity of the surrounding candidate cluster centers within a distance threshold is added to a template set of base-calling locations.


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