The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2021

Filed:

Nov. 04, 2020
Applicant:

Tencent Technology (Shenzhen) Company Limited, Shenzhen, CN;

Inventors:

Yandan Zhao, Shenzhen, CN;

Yichao Yan, Shenzhen, CN;

Weijian Cao, Shenzhen, CN;

Yun Cao, Shenzhen, CN;

Yanhao Ge, Shenzhen, CN;

Chengjie Wang, Shenzhen, CN;

Jilin Li, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/00 (2006.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06K 9/00228 (2013.01); G06K 9/00281 (2013.01); G06K 9/6256 (2013.01); G06T 7/74 (2017.01); G06T 2207/20081 (2013.01); G06T 2207/30201 (2013.01);
Abstract

This application relates to feature point positioning technologies. The technologies involve positioning a target area in a current image; determining an image feature difference between a target area in a reference image and the target area in the current image, the reference image being a frame of image that is processed before the current image and that includes the target area; determining a target figure point location of the target area in the reference image; determining a target feature point location difference between the target area in the reference image and the target area in the current image according to a feature point location difference determining model and the image feature difference; and positioning a target feature point in the target area in the current image according to the target feature point location of the target area in the reference image and the target feature point location difference.


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