The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2021

Filed:

Apr. 27, 2017
Applicant:

Entit Software Llc, Sunnyvale, CA (US);

Inventors:

Elad Benedict, Yehud, IL;

Einat Atedgi, Yehud, IL;

Ohad Assulin, Yehud, IL;

Boaz Shor, Yehud, IL;

Assignee:

MICRO FOCUS LLC, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 8/00 (2018.01); G06N 20/00 (2019.01); G06F 40/186 (2020.01); G06F 40/284 (2020.01); G06F 7/535 (2006.01); G06F 8/71 (2018.01); G06N 5/04 (2006.01); G06F 8/65 (2018.01);
U.S. Cl.
CPC ...
G06F 40/284 (2020.01); G06F 7/535 (2013.01); G06F 8/00 (2013.01); G06F 8/65 (2013.01); G06F 8/71 (2013.01); G06F 40/186 (2020.01); G06N 5/045 (2013.01); G06N 20/00 (2019.01); G06N 5/041 (2013.01);
Abstract

Techniques to create and use cluster models to predict build failures are provided. In one aspect, clusters in a set of builds may be identified. The identified clusters may be used to create a model. The model may be used to predict causes of build failures. In another aspect, a failed build may be identified. A clustering model may be retrieved. A cause of problems with the failed build may be predicted using the clustering model.


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