The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2021
Filed:
Oct. 31, 2016
Applicant:
Splunk Inc., San Francisco, CA (US);
Inventors:
Esguerra Ma Kharisma, San Mateo, CA (US);
Igor Stojanovski, San Francisco, CA (US);
Vishal Patel, San Francisco, CA (US);
Assignee:
SPLUNK INC., San Francisco, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/22 (2019.01); G06F 16/242 (2019.01); G06F 16/2455 (2019.01); G06F 16/2458 (2019.01); G06F 16/248 (2019.01); G06F 16/25 (2019.01); G06F 16/28 (2019.01); G06F 16/835 (2019.01); G06F 16/901 (2019.01); G06F 16/903 (2019.01); G06F 16/9038 (2019.01); G06F 16/951 (2019.01); G06F 16/9535 (2019.01); G06F 3/0481 (2013.01); G06T 11/20 (2006.01); H04L 12/26 (2006.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
G06F 16/248 (2019.01); G06F 3/0481 (2013.01); G06F 16/22 (2019.01); G06F 16/2228 (2019.01); G06F 16/2255 (2019.01); G06F 16/2425 (2019.01); G06F 16/2455 (2019.01); G06F 16/2462 (2019.01); G06F 16/2477 (2019.01); G06F 16/24568 (2019.01); G06F 16/25 (2019.01); G06F 16/285 (2019.01); G06F 16/8373 (2019.01); G06F 16/901 (2019.01); G06F 16/9038 (2019.01); G06F 16/90335 (2019.01); G06F 16/951 (2019.01); G06F 16/9535 (2019.01); G06T 11/206 (2013.01); H04L 67/02 (2013.01); H04L 67/025 (2013.01); G06T 2200/24 (2013.01); H04L 43/08 (2013.01);
Abstract
The disclosed embodiments include a method performed by a data intake and query system. The method includes ingesting metrics including respective key values and respective measured values, where the respective key values include a primary key value of a selected primary key. The method further includes generating a hash value for each metric by processing each primary key value with a hashing function, and indexing each metric in association with an existing hash bucket having a matching hash value.