The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2021

Filed:

Aug. 20, 2020
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Susumu Serita, San Jose, CA (US);

Chi Zhang, San Jose, CA (US);

Chetan Gupta, San Mateo, CA (US);

Qiyao Wang, Los Gatos, CA (US);

Huijuan Shao, Cupertino, CA (US);

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/30 (2006.01); G06F 11/07 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3089 (2013.01); G06F 11/076 (2013.01); G06F 11/0709 (2013.01); G06F 11/0757 (2013.01); G06F 11/3447 (2013.01);
Abstract

Aspects of the present disclosure are directed to systems and methods for determining execution of failure prediction models and duration prediction models for a sensor system. Systems and methods can involve receiving streaming data from one or more sensors and for a failure prediction model processing the streaming data indicating a predicted failure with a probability higher than a threshold, obtaining a duration of the predicted failure from a duration prediction model configured to predict durations of detected failures based on the streaming data; deactivating the failure prediction model when the predicted failure occurs; and determining a time to reactivate the failure prediction model based on the obtained duration of the predicted failure.


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