The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2021

Filed:

Feb. 25, 2019
Applicant:

Hewlett Packard Enterprise Development Lp, Houston, TX (US);

Inventors:

Daniel P. Carrington, Plano, TX (US);

Derek Sherlock, Ft. Collins, CO (US);

Timothy Pertuit, Allen, TX (US);

Alan Pippin, Ft. Collins, CO (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/27 (2006.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/27 (2013.01); G06F 11/3024 (2013.01); G06F 11/3409 (2013.01);
Abstract

A method for evaluating an electronic design under test may be performed in an environment that includes a functional verification test bench having at least one verification component coupled to the electronic design under test. The method includes provisioning the functional verification test bench to provide protocol-agnostic performance data for activity of the electronic design under test during functional verification testing of the electronic design under test. The method further includes capturing at least a part of the protocol-agnostic performance data from the at least one verification component, and calculating, from the protocol-agnostic performance data, a performance measurement for the electronic design under test.


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