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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11200049 B1

PDFFull Text
Date of Patent:
Dec. 14, 2021

Filed:

Jan. 06, 2020

Automated test authorization management

Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Yukiko Whalen, Sumida, JP;

Tomokazu Nakamura, Tokyo, JP;

Mihoko Hasegawa, Shinjuku, JP;

Akira Fujiu, Mitaka, JP;

Assignee:

International Business Machines Corporation, Armonk, NY (US);

Attorney:

Timothy J. Singleton

Primary Examiner:

Ted T Vo

Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 8/70 (2018.01); G06Q 10/06 (2012.01); G06F 11/36 (2006.01); G06F 21/12 (2013.01);
U.S. Cl.
CPC ...
G06F 8/70 (2013.01); G06F 11/366 (2013.01); G06F 11/3688 (2013.01); G06F 11/3692 (2013.01); G06F 21/121 (2013.01); G06Q 10/063112 (2013.01);
Abstract

A method, system, and computer program product for automated test authorization management is provided. The method obtains a test result, as part of an issue record, for a test of a software product. The test result contains a set of test attributes and represents an issue affecting the software product. An authorized developer is identified to assign the issue record. The method updates an authorization attribute of the test based on the test result and the authorized developer and transfers the authorization attribute to the authorized developer. The method detects a status transition of the issue record from a first status to a second status and reverts the authorization attribute of the test based on detecting the second status.

Find Patent Forward Citations

Whalen, Yukiko. (2021). Automated test authorization management (U.S. Patent No. 11200049). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11200049

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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