The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2021
Filed:
Nov. 19, 2018
Applicant:
Olympus Corporation, Hachioji, JP;
Inventor:
Keigo Matsuo, Tokyo, JP;
Assignee:
OLYMPUS CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03H 1/04 (2006.01); G03H 1/18 (2006.01); G02B 21/00 (2006.01); G03H 1/08 (2006.01); G03H 1/00 (2006.01);
U.S. Cl.
CPC ...
G03H 1/0486 (2013.01); G02B 21/0008 (2013.01); G03H 1/0443 (2013.01); G03H 1/0866 (2013.01); G03H 1/182 (2013.01); G03H 2001/0033 (2013.01); G03H 2001/0447 (2013.01); G03H 2001/0452 (2013.01); G03H 2001/0454 (2013.01); G03H 2226/02 (2013.01);
Abstract
An illumination unit emits an illumination light to a specimen. An image sensor includes multiple pixels arranged in a two-dimensional manner. The image sensor captures an image of the intensity distribution of an interference pattern formed due to the illumination light that has interacted with the specimen, and outputs image data. A defect information acquisition unit acquires defect position information that indicates the positions of defective pixels of the image sensor. A processing unit reconstructs a subject image that represents the specimen based on the image data and the defect position information.