The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2021

Filed:

Jan. 17, 2018
Applicant:

Credo Technology Group Limited, Grand Cayman, KY;

Inventor:

Calvin Xiong Fang, Palo Alto, CA (US);

Assignee:

Credo Technology Group Limited, Grand Cayman, KY;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3183 (2006.01); G01R 31/28 (2006.01); G01R 31/317 (2006.01); G01R 31/319 (2006.01); H01L 25/065 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318385 (2013.01); G01R 31/2836 (2013.01); G01R 31/2853 (2013.01); G01R 31/31703 (2013.01); G01R 31/31926 (2013.01); H01L 25/0655 (2013.01);
Abstract

Accordingly, an improved interposer connection testing technique is provided, employing parallel pseudo-random bit sequence (PRBS) generators to test all the interconnects in parallel and simultaneously detect any correctable defects. In one embodiment, a microelectronic assembly includes an interposer electrically connected in a flip-chip configuration to an originating IC (integrated circuit) die and to a destination IC die, the substrate having multiple conductive traces for a parallel communications bus between the IC dies. The originating IC die has a first parallel PRBS (pseudo-random binary sequence) generator to drive test PRBSs with different phases in parallel across the interposer traces. The destination IC die has a second parallel PRBS generator to create reference PRBSs with different phases, and a bitwise comparator coupled to receive the test PRBSs from the interposer traces and to compare them to the reference PRBSs to provide concurrent fault monitoring for each of the traces.


Find Patent Forward Citations

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Fang, Calvin. (2021). Ic dies with parallel prbs testing of interposer (U.S. Patent No. 11199584). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11199584

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