The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2021

Filed:

Nov. 13, 2017
Applicant:

Screen Holdings Co., Ltd., Kyoto, JP;

Inventors:

Tsutomu Sakuyama, Kyoto, JP;

Shohei Otsuki, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/952 (2006.01); G01M 13/021 (2019.01); G01N 21/88 (2006.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
G01N 21/952 (2013.01); G01M 13/021 (2013.01); G01N 21/8806 (2013.01); G01N 21/9515 (2013.01);
Abstract

An inspection apparatus for inspecting a workpiece having an outer peripheral portion rotationally symmetric about a symmetry axis with projections and recesses provided periodically and repeatedly, the apparatus comprises: an edge imaging mechanism that captures an image of an edge portion of a projection of a rotated workpiece; an upstream imaging mechanism that captures an image of an upstream wall surface of the rotated workpiece; and a downstream imaging mechanism that captures an image of a downstream wall surface of the rotated workpiece. The inspection apparatus inspects the workpiece on the basis of the images captured by the edge imaging mechanism, the upstream imaging mechanism, and the downstream imaging mechanism.


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Sakuyama, Tsutomu. (2021). Inspection apparatus and inspection method (U.S. Patent No. 11199509). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11199509

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