The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2021
Filed:
Dec. 15, 2016
Shenzhen Institute of Terahertz Technology and Innovation Co., Ltd., Shenzhen, CN;
Shenzhen Institute of Terahertz Technology and Innovation, Shenzhen, CN;
Shenzhen Institute of Terahertz Technology and Innovation Co., Ltd., Shenzhen, CN;
Shenzhen Institute of Terahertz Technology and Innovation, Shenzhen, CN;
Abstract
The invention relates to a terahertz full polarization state detection spectrometer, which comprises a terahertz wave generator, a polarizer, a polarization splitter, a horizontal terahertz detector and a vertical terahertz detector. The terahertz wave generator generates a terahertz wave and the polarizer optimizes the terahertz wave for purity. The sample to be detected modulates the terahertz wave after purity optimization to obtain the terahertz modulated wave. The terahertz modulated wave is decomposed by the polarization splitter into a horizontal terahertz wave and a vertical terahertz wave whose polarization states are perpendicular to each other. The two terahertz waves are detected by two corresponding terahertz detectors respectively. According to the detected result, the characteristic of the sample is analyzed. The terahertz full polarization state detection spectrometer can quickly and accurately detect all kinds of full polarization state terahertz waves and improve the detection accuracy and efficiency of the sample.