The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2021
Filed:
Nov. 13, 2019
Samsung Electronics Co., Ltd., Suwon-si, KR;
Hyeong Seok Jang, Seoul, KR;
Jae Wook Shim, Yongin-si, KR;
Hyun Seok Moon, Hwaseong-si, KR;
Kun Sun Eom, Yongin-si, KR;
Jun Ho Lee, Incheon, KR;
Myoung Hoon Jung, Bucheon-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
An apparatus for measuring a spectrum includes a light source array configured to emit light towards an object, a photodetector configured to detect light reflected by the object; and a processor configured to measure, using the light source array and the photodetector, a plurality of temperature correction spectra based on a temperature change of the light source array, obtain a light source temperature drift vector by analyzing the measured plurality of temperature correction spectra, measure, using the light source array and the photodetector, an analysis spectrum by using the light source array and the photodetector, and adjust the measured analysis spectrum to reduce an effect of the temperature change of the light source array by using the obtained light source temperature drift vector.