The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2021

Filed:

Dec. 20, 2017
Applicants:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Horiba Abx Sas, Montpellier, FR;

Inventors:

Pierre Blandin, Coublevie, FR;

Anais Ali-Cherif, Clermont Ferrand, FR;

Estelle Gremion, La Tour du Pin, FR;

Sebastien Raimbault, Argelliers, FR;

Olivier Cioni, Grenoble, FR;

Aurelien Daynes, Montpellier, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 15/14 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1475 (2013.01); G01N 15/1463 (2013.01); G01N 2015/008 (2013.01); G01N 2015/0073 (2013.01); G01N 2015/1486 (2013.01);
Abstract

The invention relates to a method for counting particles, particularly blood cells, in a sample, using a lensless optical imaging device. The sample is arranged between a light source and an image sensor. The sample is illuminated by a light source and an image is acquired by the image sensor, said image sensor being exposed to a light wave called an exposition wave. A digital propagation operator is applied to the acquired image so as to obtain a complex amplitude of the exposition wave according to a surface facing the image sensor. An image, called a reconstructed image, is formed from the modulus and/or the phase of said complex amplitude, on which image the particles to be counted appear in the form of regions of interest. The method then comprises a step of selecting the regions of interest corresponding to the particles to be counted.


Find Patent Forward Citations

Loading…