The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2021

Filed:

Mar. 21, 2018
Applicants:

University of Washington, Seattle, WA (US);

The Regents of the University of California, Oakland, CA (US);

Inventors:

Jianzhu Yin, Seattle, WA (US);

Jonathan Posner, Seattle, WA (US);

Veronica J. Santos, Oakland, CA (US);

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 5/161 (2020.01); G01L 5/22 (2006.01); G01L 1/22 (2006.01);
U.S. Cl.
CPC ...
G01L 5/226 (2013.01); G01L 1/2287 (2013.01); G01L 5/161 (2013.01);
Abstract

An example sensor device is provided. The sensor device includes (a) a substrate having a first end and a second end, wherein the substrate includes a contact portion, a first sensor portion positioned between the first end of the substrate and the contact portion, and a second sensor portion positioned between the second end of the substrate and the contact portion, (b) a first strain gauge sensor positioned at the first sensor portion, and (c) a second strain gauge sensor positioned at the second sensor portion, wherein the first end of the substrate and the second end of the substrate are configured to be coupled to a rigid curved surface, and wherein the sensor device is configured such that a force applied to the contact portion of the substrate will be sensed by each of the first strain gauge sensor and the second strain gauge sensor.


Find Patent Forward Citations

Loading…