The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2021

Filed:

Oct. 03, 2018
Applicant:

Magik Eye Inc., New York, NY (US);

Inventor:

Akiteru Kimura, Hachioji, JP;

Assignee:

MAGIK EYE INC., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); G01C 3/08 (2006.01); G01B 11/02 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/25 (2013.01); G01B 11/026 (2013.01); G01C 3/08 (2013.01); G06K 9/00791 (2013.01); G06T 2207/10028 (2013.01);
Abstract

A projection pattern is projected onto a surface of an object from a projection point of a distance by projecting a plurality of beams of light from the projection point. The plurality of beams of light creates a plurality of projection artifacts that is arranged in a grid on the surface of the object. A center projection artifact lies at an intersection of a grid longitude line and a grid latitude line. A projection of the plurality of beams is adjusted so that the longitude line and/or the latitude line is rotated by a predetermined amount from an original position to a new position, resulting in an adjusted projection pattern on the surface of the object. An image of the object, including at least a portion of the adjusted projection pattern, is captured. A distance from the distance sensor to the object is calculated using information from the image.


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