The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 14, 2021

Filed:

Dec. 15, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Govind Kaigala, Zürich, CH;

Robert Dean Lovchik, Zürich, CH;

David Taylor, Zürich, CH;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B01L 3/00 (2006.01); B01L 3/02 (2006.01); G01N 35/04 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
B01L 3/50273 (2013.01); B01L 3/0293 (2013.01); B01L 3/502715 (2013.01); B01L 2200/027 (2013.01); B01L 2200/0605 (2013.01); B01L 2300/0861 (2013.01); B01L 2300/0887 (2013.01); B01L 2400/0487 (2013.01); G01N 2035/1034 (2013.01);
Abstract

A microfluidic probe includes a probe head with a processing surface that includes a first aperture and a second aperture. The probe further includes a liquid injection channel, which leads to the first aperture, and a liquid aspiration channel, which extends from the second aperture. The probe also includes a bypass channel, arranged so as to fluidly connect the liquid injection channel to the liquid aspiration channel, as well as a control channel. The latter fluidly connects to the bypass channel, hence forming a junction therewith, so as to define two portions of the bypass channel. These portions includes: a first portion that extends from the junction to the liquid injection channel; and a second portion that extends from that same junction to the liquid aspiration channel. The invention is further directed to methods of operation of a probe as described above, to process a surface.


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