The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 2021
Filed:
Jan. 31, 2020
Applicant:
Fujifilm Corporation, Tokyo, JP;
Inventor:
Kenichiro Tamaki, Kanagawa, TW;
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61M 37/00 (2006.01);
U.S. Cl.
CPC ...
A61M 37/0015 (2013.01); A61M 2037/003 (2013.01); A61M 2037/0023 (2013.01); A61M 2037/0053 (2013.01);
Abstract
Provided are a microneedle array capable of improving the visibility of an appearance inspection, and a manufacturing method of the same. A microneedle array is a microneedle array including: a sheet portion having a first surface and a second surface which oppose each other; and a plurality of needle portions arranged on the first surface of the sheet portion, in which the second surface of the sheet portion is configured by a rough surface having peak portions and valley portions, and an average transmittance of the sheet portion in a wavelength range of 300 nm to 740 nm is 75% or less.