The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2021
Filed:
Oct. 15, 2020
Macom Technology Solutions Holdings, Inc., Lowell, MA (US);
George L. Barrier, IV, Lowell, MA (US);
MACOM Technology Solutions Holdings, Inc., Lowell, MA (US);
Abstract
An improved method and system for locating a slicer threshold and phase is disclosed. A two-dimensional field of coordinates is defined using phase versus eye monitor magnitude. At each coordinate, the number of samples above the eye monitor magnitude are counted. Dividing by the total number of samples considered yields a ratio between 0 and 1. Each eye 0, 1, 2 (bottom, middle, top in a PAM4 system) has an ideal ratio (75%, 50%, 25%) assuming a balanced distribution of PAM4 levels. The rating (third dimension) at each coordinate is calculated to be (0.25−abs.value (actual_ratio−ideal_ratio)) limited to positive results only. The resulting ratings are summed over phase. The eye center is calculated using weighted average of the sums. The eye center is compared to the calibrated target to determine which way to move the slicer threshold.