The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2021
Filed:
Apr. 22, 2016
Applicant:
Nikon Corporation, Tokyo, JP;
Inventors:
Motoi Murakami, Yokohama, JP;
Junichi Kubota, Yokohama, JP;
Assignee:
Nikon Corporation, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/60 (2017.01); G01B 11/02 (2006.01); G06T 7/50 (2017.01); G01B 11/24 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/60 (2013.01); G01B 11/02 (2013.01); G01B 11/022 (2013.01); G01B 11/24 (2013.01); G06T 7/0004 (2013.01); G06T 7/50 (2017.01);
Abstract
To contribute to improved usability, an image measurement method includes selectably displaying geometric shape-related information in a measurement target, selectably displaying a measurement candidate of the measurement target based on a geometric shape corresponding to the selected geometric shape-related information (S), and outputting a calculation result of the selected measurement candidate.
Murakami, Motoi. (2021). Image measurement method, image measurement program, image measurement device, and object manufacture method (U.S. Patent No. 11195294). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11195294
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile