The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 2021

Filed:

Jan. 15, 2020
Applicant:

Samsung Electronics Co., Ltd., Gyeonggi-do, KR;

Inventors:

Kostiantyn Morozov, Kyiv, UA;

Dmytro Vavdiiuk, Kyiv, UA;

Oleksandr Klimenkov, Kyiv, UA;

Andrii Sukhariev, Kyiv, UA;

Ivan Safonov, Kyiv, UA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/521 (2017.01); G06K 9/46 (2006.01); G01B 11/25 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06T 7/521 (2017.01); G01B 11/25 (2013.01); G06K 9/4604 (2013.01); G06K 9/6215 (2013.01); G06T 2207/10028 (2013.01);
Abstract

An apparatus and method are provided and include an interface unit configured to receive an electrical signal based on light received from a camera; and at least one processor configured to obtain depth information of a scene based on the electrical signal received from the interface unit, wherein the at least one processor is configured to identify a recognition pattern corresponding to the light received by the camera based on the electrical signal, to obtain a total distance value between properties of a partial source pattern corresponding to a target fragment in the source pattern and properties of a partial recognition pattern corresponding to the target fragment in the recognition pattern, and to estimate depth information of the target fragment based on the obtained total distance value.


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