The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11195108 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 07, 2021

Filed:

Apr. 07, 2020
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventor:

Shinya Taguchi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08B 21/00 (2006.01); G06N 5/04 (2006.01); G06N 20/00 (2019.01); A61B 5/11 (2006.01); A61B 5/18 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); A61B 5/1116 (2013.01); A61B 5/18 (2013.01); A61B 5/7267 (2013.01); G06N 20/00 (2019.01);
Abstract

An abnormality detection device acquires sensor information indicating a state of a person and device information indicating a state of a device, determines whether there is a combination corresponding to the acquired sensor information and acquired device information in a learning database, and determines whether there is sensor information or device information corresponding to the acquired sensor information or the acquired device information in a behavior pattern database. If it is determined that the acquired sensor information is not in a normal range, the device determines that a current state is in the normal state when it is determined that there is the corresponding combination, and determines that the current state is in an abnormal state when it is determined that there is no corresponding combination and no corresponding sensor information or device information.


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Taguchi, Shinya. (2021). Abnormality detection device and abnormality detection method for a user (U.S. Patent No. 11195108). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11195108

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