The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 2021

Filed:

May. 29, 2020
Applicant:

Uipco, Llc, San Antonio, TX (US);

Inventors:

Eric David Schroeder, San Antonio, TX (US);

Manfred Amann, San Antonio, TX (US);

Jess W. Gingrich, San Antonio, TX (US);

Donnette Moncrief Brown, San Antonio, TX (US);

Robert Wiseman Simpson, Fair Oaks Ranch, TX (US);

Daniel Diaz, San Antonio, TX (US);

Abbey Erin May, Boerne, TX (US);

Jay Wesley Mullen, San Antonio, TX (US);

David Edward Garrison, San Antonio, TX (US);

Michael James Leach, San Antonio, TX (US);

Karen Marie Shackelford-George, San Antonio, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/0063 (2013.01); G06T 7/0002 (2013.01); G06T 2207/10032 (2013.01);
Abstract

A system and method for capturing and processing aerial images of structures to assess structural damage is disclosed. The system comprises an aerial system associated with an aerial vehicle, which is in contact with a ground system. The aerial system is used to capture images of selected locations associated with known structures and crop those images around the selected locations. The cropped images are then fed into a damage classifier that automatically classifies the degree of damage done to structures at the selected locations. The system and method may be deployed to quickly assess damage of structures in a disaster area.


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