The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2021
Filed:
Mar. 16, 2020
International Business Machines Corporation, Armonk, NY (US);
Andrew C. M. Hicks, Wappingers Falls, NY (US);
Ryan Thomas Rawlins, New Paltz, NY (US);
Dale E. Blue, Poughkeepsie, NY (US);
Jacob Thomas Snyder, New Fairfield, CT (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A method for testing a system under test (SUT) in an active environment includes generating, by a testing system, several tests for testing the SUT. The tests are generated based on a coverage model of the SUT, which includes multiple attributes. The method further includes creating, by the testing system, a minimal set of tests from the tests by selecting tests that do not exceed a predetermined performance threshold. The method further includes executing, by the testing system, the minimal set of tests on the SUT for analyzing a soft failure of the SUT in the active environment. The soft failure occurs in the active environment during execution of the SUT based at least in part on a performance parameter of the active environment.