The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2021
Filed:
Jun. 12, 2019
Fanuc Corporation, Yamanashi, JP;
Gaku Isobe, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
An abnormality detection device of a machine tool including a spindle and a feed axis and includes: a load monitoring unit that monitors a load of the spindle or the feed axis; a machining state determination unit that determines that the machine tool is in a machining state when the load of the spindle or the feed axis is equal to or larger than a threshold; a storage unit that stores shape data of the work and shape data of the tool in advance; an interfering area calculation unit that calculates an interfering area in which the tool interferes with the work based on the shape data of the work and the shape data of the tool; and an abnormality detection unit that detects an abnormality in the machine tool by comparing a position of the tool in relation to the work when it is determined that the machine tool is in the machining state with the calculated interfering area.