The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11194303 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 07, 2021

Filed:

Dec. 03, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Jim C. Chen, Rochester, MN (US);

John M. Santosuosso, Rochester, MN (US);

Jason A. Nikolai, Rochester, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/042 (2006.01); G06F 11/07 (2006.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
G05B 19/042 (2013.01); G06F 11/0736 (2013.01); G06N 5/02 (2013.01); G05B 2219/26 (2013.01); G05B 2219/2642 (2013.01); G06F 11/079 (2013.01); G06F 11/0751 (2013.01); G06F 11/0769 (2013.01);
Abstract

A method, system and computer program product are provided for implementing anomaly detection and notification through profiled context. Anomalies are detected by effectively using multiple devices and using predefined profiles to generate a contextual comparison for subtle differences detected. When predefined subtle anomalies are detected using at least one of the predefined profiles, a selected notification is provided.


Find Patent Forward Citations

Chen, Jim. (2021). Method and system for anomaly detection and notification through profiled context (U.S. Patent No. 11194303). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11194303

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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