The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2021
Filed:
Dec. 23, 2016
Applicant:
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Inventors:
Florian Fahrbach, Mannheim, DE;
Werner Knebel, Kronau, DE;
Assignee:
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 7/04 (2021.01); G02B 21/00 (2006.01); G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G02B 7/04 (2013.01); G02B 21/006 (2013.01); G02B 21/0032 (2013.01); G02B 21/0076 (2013.01); G02B 27/0068 (2013.01);
Abstract
A method for examining a sample by light sheet microscopy includes illuminating a sample surface located in an illumination plane by a light sheet propagating in the illumination plane. A position of a light sheet focal point of the light sheet in the illumination plane is moved by changing an optical length of a light path of illumination light forming the light sheet. Detection light emanating from the illumination plane is detected.