The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 2021
Filed:
Jul. 24, 2015
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Michael Ganser, Giessen, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A method for optically examining or manipulating a microscopic sample includes positioning the sample in front of a lens which is arranged both in an observation beam path and in an illumination beam path of a microscope which has a main beam splitter which separates the paths. An illumination device is selected depending on the type of sample or examination, or a manipulation of the sample to be carried out. The selected illumination device is coupled in a predefined desired position to a mechanical coupling interface of the microscope. An illumination light from the selected illumination device is directed along the illumination beam path to the main beam splitter and from there to the lens and through the lens onto the sample. No optical component for imaging, focusing and/or defocusing is arranged on a light path of the illumination light between the optical apparatus and the lens.